Lumetrics Metrology Blog

Explore our articles, videos, and insights on non contact thickness measurement, precision metrology methods, and metrology application trends.
February 27, 2023

OptiGauge II versus OptiGauge EMS: Features and key differences

Watch "Lab Dave" (Technology Development Scientist at Lumetrics) as he demonstrates the ...
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January 17, 2023

Determining Group Refractive Index utlizing the Lumetrics OptiGauge II and RICS Fixture

The refractive index (RI) of a material is how much light is refracted or reflected when ...
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October 25, 2022

Automated Optical Inspection and Multi Layer Measurement

Utilizing optical metrology solutions such as the Lumetrics OptiGauge II to measure ...
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August 24, 2022

Multi Layer Stack Measurement using a Robot and OptiGauge II

In our newest video, David Compertore, Lumetrics' Principal Scientist, measures a stack ...
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July 27, 2022

Lens Stack Measurement

Did you know that we all carry lens stacks in our pockets? That’s right!  Your cell phone ...
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July 12, 2022

Measuring Curvature using a Lumetrics Reference Signal Generator (RSG)

The addition of a reference surface allows the Lumetrics OptiGauge to provide more than ...
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June 6, 2022

Multi Layer Video

Optical Metrology Provides Unique Insights into Multi Layer Materials  
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May 11, 2022

Product Quality Testing: Monitoring Fluid Concentrations Using the Index of Refraction

Improving Speed and Precision of Concentration Monitoring with Non-Contact Measurement ...
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March 25, 2022

Video Feature: Semiconductor Chip Metrology

Using Non-Contact Low Coherence Interferometry to Improve Wafer Inspection & Quality ...
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February 15, 2022

Achieving Higher Quality & Efficiencies with Non-Contact Thickness Measurement

Exploring the Role of Interferometry in Medical Device Manufacturing The ability to ...
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