Lumetrics Metrology Blog

Explore our articles, videos, and insights on non contact thickness measurement, precision metrology methods, and metrology application trends.
October 25, 2022

Automated Optical Inspection and Multi Layer Measurement

Utilizing optical metrology solutions such as the Lumetrics OptiGauge II to measure ...
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August 24, 2022

Multi Layer Stack Measurement using a Robot and OptiGauge II

In our newest video, David Compertore, Lumetrics' Principal Scientist, measures a stack ...
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July 27, 2022

Lens Stack Measurement

Did you know that we all carry lens stacks in our pockets? That’s right!  Your cell phone ...
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July 12, 2022

Measuring Curvature using a Lumetrics Reference Signal Generator (RSG)

The addition of a reference surface allows the Lumetrics OptiGauge to provide more than ...
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June 6, 2022

Multi Layer Video

Optical Metrology Provides Unique Insights into Multi Layer Materials  
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May 11, 2022

Product Quality Testing: Monitoring Fluid Concentrations Using the Index of Refraction

Improving Speed and Precision of Concentration Monitoring with Non-Contact Measurement ...
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March 25, 2022

Video Feature: Semiconductor Chip Metrology

Using Non-Contact Low Coherence Interferometry to Improve Wafer Inspection & Quality ...
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February 15, 2022

Achieving Higher Quality & Efficiencies with Non-Contact Thickness Measurement

Exploring the Role of Interferometry in Medical Device Manufacturing The ability to ...
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January 25, 2022

2022 Semiconductor & Chip Market Outlook

Global Shortage of Silicon Wafer Chips Fuels Ongoing Growth and High Throughput Demand ...
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January 14, 2022

Advancing Quality Assurance with White Light Interferometry

Non-Contact Measurement Supports Growth in Consumer Electronics Market The demand for ...
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