LUMOS-V Now Available for Refractive Index Measurement

At Lumetrics, innovation is in our DNA, and today, we’re proud to unveil our latest advancement: LUMOS-V, the highest precision, commercially available non-contact refractive index (RI) metrology system designed specifically for soft contact lens manufacturing.

The LUMOS-V sets a new standard that is an order of magnitude more precise than the current Abbe refractometer methodology.

Developed in collaboration with Johnson & Johnson MedTech, LUMOS-V sets a new standard in precision, delivering RI accuracy of .001 that is 20 times more sensitive than traditional Abbe refractometers. LUMOS-V is well-suited for both R&D and production environments, with mature software, documentation, and support needed for a growing user base.

"We have a long history in ophthalmic measurement and are fully committed to meeting today’s and tomorrow’s needs," said John Hart, President and CEO of Lumetrics. “As supply chains shift in contact lens manufacturing, LUMOS-V can help ensure consistent quality in materials and output, facility to facility, supplier to supplier.”

Built on Lumetrics’ patented multi-spectral low coherence interferometry (MSLCI) technology, LUMOS-V offers:

• RI accuracy of ±0.001
• RI material characterization accuracy of +/- .001 with a sensitivity of .0002
• Seamless integration into existing workflows
• Robust software and documentation for fast onboarding

Whether you're developing next-gen lenses or scaling production, LUMOS-V is engineered to support your goals with unmatched precision and reliability. 

For more information on how LUMOS-V can transform your ophthalmic metrology processes, contact us at sales@lumetrics.com.