Multi Layer Stack Measurement using a Robot and OptiGauge II
In our newest video, David Compertore, Lumetrics' Principal Scientist, measures a stack ...
Lens Stack Measurement
Did you know that we all carry lens stacks in our pockets? That’s right! Your cell phone ...
Measuring Curvature using a Lumetrics Reference Signal Generator (RSG)
The addition of a reference surface allows the Lumetrics OptiGauge to provide more than ...
Multi Layer Video
Optical Metrology Provides Unique Insights into Multi Layer Materials
Achieving Higher Quality & Efficiencies with Non-Contact Thickness Measurement
Exploring the Role of Interferometry in Medical Device Manufacturing The ability to ...
Semiconductor & Chip Market Outlook
Global Shortage of Silicon Wafer Chips Fuels Ongoing Growth and High Throughput Demand ...
Advancing Quality Assurance with White Light Interferometry
Non-Contact Measurement Supports Growth in Consumer Electronics Market The demand for ...
Maximize Semiconductor Production With Help from Advanced Interferometry
By Dave Compertore, Scientist, Lumetrics®, Inc. Over the past several years, shortages of ...
Certification of Contact Lenses as Calibration Standards
Quality control processes can often lag behind advances in technology. For example, ...
Measuring Thickness Uniformity of an Adhesive Deposited on Top of a Porous Substrate
Abstract — We describe a technique for non‐contact thickness measurement that can be ...