OptiGauge II versus OptiGauge EMS: Features and key differences
Watch "Lab Dave" (Technology Development Scientist at Lumetrics) as he demonstrates the ...
Multi Layer Stack Measurement using a Robot and OptiGauge II
In our newest video, David Compertore, Lumetrics' Principal Scientist, measures a stack ...
Lens Stack Measurement
Did you know that we all carry lens stacks in our pockets? That’s right! Your cell phone ...
Measuring Curvature using a Lumetrics Reference Signal Generator (RSG)
The addition of a reference surface allows the Lumetrics OptiGauge to provide more than ...
Multi Layer Video
Optical Metrology Provides Unique Insights into Multi Layer Materials
Achieving Higher Quality & Efficiencies with Non-Contact Thickness Measurement
Exploring the Role of Interferometry in Medical Device Manufacturing The ability to ...
Semiconductor & Chip Market Outlook
Next-Gen Technologies Fuel Global Silicon Chip Growth and Throughput Demand The global ...
Advancing Quality Assurance with White Light Interferometry
Non-Contact Measurement Supports Growth in Consumer Electronics Market The demand for ...
Maximize Semiconductor Production With Help from Advanced Interferometry
By Dave Compertore, Scientist, Lumetrics®, Inc. Over the past several years, shortages of ...
Certification of Contact Lenses as Calibration Standards
Quality control processes can often lag behind advances in technology. For example, ...