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Explore our articles, videos, and insights on precision metrology methods and metrology application trends.
June 6, 2022

Multi Layer Video

Optical Metrology Provides Unique Insights into Multi Layer Materials  
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March 25, 2022

Video Feature: Semiconductor Chip Metrology

Using Non-Contact Low Coherence Interferometry to Improve Wafer Inspection & Quality ...
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February 15, 2022

Achieving Higher Quality & Efficiences with Non-Contact Thickness Measurement

Exploring the Role of Interferometry in Medical Device Manufacturing The ability to ...
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January 25, 2022

2022 Semiconductor & Chip Market Outlook

Global Shortage of Silicon Wafer Chips Fuels Ongoing Growth and High Throughput Demand ...
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January 14, 2022

Advancing Quality Assurance with White Light Interferometry

Non-Contact Measurement Supports Growth in Consumer Electronics Market The demand for ...
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November 8, 2021

Maximize Semiconductor Production With Help from Advanced Interferometry

By Dave Compertore, Scientist, Lumetrics®, Inc. Over the past several years, shortages of ...
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July 12, 2018

Lumetrics' Latest Patent

On June 26th, 2018, Lumetrics was awarded a new patent for “Associated Interferometers ...
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August 17, 2017

Thickness Measurement of Opaque Materials Using Interferometry

Abstract— Lumetrics has developed a fixture that expands precision measurement ...
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June 21, 2017

Real-time Group Refractive Index Measurement Of Fluids Using Interferometry

Abstract — Maintaining proper chemical composition of fluids is an important control ...
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May 31, 2017

Automated Dimensional Measurement of Microfluidic Flow Cells

Abstract—Lumetrics, Inc. (Rochester, NY) has made inspection of internal dimensions of ...
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