• Sales
  • Careers
  • Blog
Close
  • About
    • About Us
      • Our Company
      • Leadership
      • Events
      • Careers
  • Products
    • Non Contact Thickness Measurement Systems
      • OptiGauge MIR
      • OptiGauge II
      • OptiGauge 2000
      • OptiGauge 600
      • OptiGauge II EMS
      • LUMOS-V
      • STMS
      • LumetriScan 360
      • Software
      • Accessories
    • Wavefront Measurement Systems
      • CLAS-NX
      • CLAS-FX
      • ClearWave Plus
      • Software
      • Accessories
  • Services
    • Our Services
      • Test & Measurement Services
      • Discovery Service
      • Custom Metrology
      • Accessories
  • Applications
    • Applications
      • Mid-Infrared Measurement
      • Multi Layer Thickness Measurement
      • Silicon Wafer Measurement
      • Glass Inspection + Measurement
      • Automotive Glass
      • Medical Device Inspection
      • Ophthalmic Metrology
  • Resources
    • Our Resources
      • Lumetrics Blog
      • White Papers
      • Application Notes
      • Videos
      • FAQs
  • Videos
SEARCH
Contact Us
lumetrics-logo lumetrics-logo-inverse
  • About
    • About Us
      • Our Company
      • Leadership
      • Events
      • Careers
  • Products
    • Non Contact Thickness Measurement Systems
      • OptiGauge MIR
      • OptiGauge II
      • OptiGauge 2000
      • OptiGauge 600
      • OptiGauge II EMS
      • LUMOS-V
      • STMS
      • LumetriScan 360
      • Software
      • Accessories
    • Wavefront Measurement Systems
      • CLAS-NX
      • CLAS-FX
      • ClearWave Plus
      • Software
      • Accessories
  • Services
    • Our Services
      • Test & Measurement Services
      • Discovery Service
      • Custom Metrology
      • Accessories
  • Applications
    • Applications
      • Mid-Infrared Measurement
      • Multi Layer Thickness Measurement
      • Silicon Wafer Measurement
      • Glass Inspection + Measurement
      • Automotive Glass
      • Medical Device Inspection
      • Ophthalmic Metrology
  • Resources
    • Our Resources
      • Lumetrics Blog
      • White Papers
      • Application Notes
      • Videos
      • FAQs
  • Videos
Contact Us

Lumetrics Metrology Blog

Explore our articles, videos, and insights on non contact thickness measurement, precision metrology methods, and metrology application trends.
January 25, 2022

Semiconductor & Chip Market Outlook

Global Shortage of Silicon Wafer Chips Fuels Ongoing Growth and High Throughput Demand ...
Start Reading
January 14, 2022

Advancing Quality Assurance with White Light Interferometry

Non-Contact Measurement Supports Growth in Consumer Electronics Market The demand for ...
Start Reading
November 8, 2021

Maximize Semiconductor Production With Help from Advanced Interferometry

By Dave Compertore, Scientist, Lumetrics®, Inc. Over the past several years, shortages of ...
Start Reading
July 12, 2018

Lumetrics' Latest Patent

On June 26th, 2018, Lumetrics was awarded a new patent for “Associated Interferometers ...
Start Reading
August 17, 2017

Thickness Measurement of Opaque Materials Using Interferometry

Abstract— Lumetrics has developed a fixture that expands precision measurement ...
Start Reading
June 21, 2017

Real-time Group Refractive Index Measurement Of Fluids Using Interferometry

Abstract — Maintaining proper chemical composition of fluids is an important control ...
Start Reading
May 31, 2017

Automated Dimensional Measurement of Microfluidic Flow Cells

Abstract—Lumetrics, Inc. (Rochester, NY) has made inspection of internal dimensions of ...
Start Reading
Lumetrics logo_icon only
Custom and standardized non contact thickness measurement and optical inspection systems.
  • Products
  • Services
  • Applications
  • Resources
All rights reserved
  • Privacy Policy