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  • About
    • About Us
      • Our Company
      • Leadership
      • Events
      • Careers
  • Products
    • Non Contact Thickness Measurement Systems
      • OptiGauge MIR
      • OptiGauge II
      • OptiGauge 2000
      • OptiGauge 600
      • OptiGauge II EMS
      • LUMOS-V
      • STMS
      • LumetriScan 360
      • Software
      • Accessories
    • Wavefront Measurement Systems
      • CLAS-NX
      • CLAS-FX
      • ClearWave Plus
      • Software
      • Accessories
  • Services
    • Our Services
      • Test & Measurement Services
      • Discovery Service
      • Custom Metrology
      • Accessories
  • Applications
    • Applications
      • Mid-Infrared Measurement
      • Multi Layer Thickness Measurement
      • Silicon Wafer Measurement
      • Glass Inspection + Measurement
      • Automotive Glass
      • Medical Device Inspection
      • Ophthalmic Metrology
  • Resources
    • Our Resources
      • Lumetrics Blog
      • White Papers
      • Application Notes
      • Videos
      • FAQs
  • Videos
Contact Us

Lumetrics Metrology Blog

Explore our articles, videos, and insights on non contact thickness measurement, precision metrology methods, and metrology application trends.
April 25, 2017

International Converting Exhibition: Measuring Multi-layer films and coatings

Lumetrics and InDev A-C-T (www.indevsystems.com) are co-exhibiting at the ICE ...
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March 3, 2016

Women in Optics: Mary Banning Friedlander developed multi-layer low reflecting coatings

Rochester, New York is not just the “birthplace” of the thriving optics industry as we ...
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May 6, 2014

Tested Samples: Critical Adhesive Thickness Measurement

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