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  • About
    • About Us
      • Our Company
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  • Products
    • Non Contact Thickness Measurement Systems
      • OptiGauge MIR
      • OptiGauge II
      • OptiGauge 2000
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      • OptiGauge II EMS
      • LUMOS-V
      • STMS
      • LumetriScan 360
      • Software
      • Accessories
    • Wavefront Measurement Systems
      • CLAS-NX
      • CLAS-FX
      • ClearWave Plus
      • Software
      • Accessories
  • Services
    • Our Services
      • Test & Measurement Services
      • Discovery Service
      • Custom Metrology
      • Accessories
  • Applications
    • Applications
      • Mid-Infrared Measurement
      • Multi Layer Thickness Measurement
      • Silicon Wafer Measurement
      • Glass Inspection + Measurement
      • Automotive Glass
      • Medical Device Inspection
      • Ophthalmic Metrology
  • Resources
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Lumetrics Metrology Blog

Explore our articles, videos, and insights on non contact thickness measurement, precision metrology methods, and metrology application trends.
September 10, 2018

Optical Thickness Measurement of Multilayer Films

Abstract — Manufacturers of multi-layer films can realize significant cost savings, ...
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April 25, 2017

International Converting Exhibition: Measuring Multi-layer films and coatings

Lumetrics and InDev A-C-T (www.indevsystems.com) are co-exhibiting at the ICE ...
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March 30, 2017

Measurement of Film Stacks

The field of touchscreen technology is undergoing an explosive growth and development. It ...
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February 7, 2017

Online multilayer film system

A customer presented Lumetrics with a 5 layer product constructed of a liner, adhesive, ...
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