April 23, 2020

Measuring Thickness Uniformity of an Adhesive Deposited on Top of a Porous Substrate

Abstract — We describe a technique for non‐contact thickness measurement that can be applied for samples that do not have smooth reflecting surfaces. An example is an adhesive deposited on top of a foam substrate. We use low‐coherence interferometery to obtain an array (a scan) of single‐point measurements using standard OptiGauge Control Center (OCC) software. We describe the algorithm for data processing to extract the effective thickness data for the adhesive layer.

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