Wavefront Measurement

Wavefront Measurement Systems using the Shack-Hartmann Sensor

Lumetrics has applied the ingenious Shack-Hartmann sensor to a range of wavefront measurement systems ideal for analyzing optics-related products and materials, from contact lenses to intraocular lenses to laser beam analysis, surface measurement, and phase parameters. While Shack-Hartmann technology may be widely adopted in the wavefront metrology industry, Lumetrics has applied the technology in unique ways and added industry-leading hardware and software features to our systems that offer you significant advantages over our competitors.


Products

ClearWave™ Plus

ClearWave™ Plus

The ClearWave™ Plus combines a ClearWave with the industry standard OptiGauge® non-contact thickness measurement system. This provides contact lens manufacturers center thickness (CT), Sagittal Height (SAG), diameter, radius of curvature, and all the wavefront measurements that currently require three separate systems to obtain.

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CLAS-2D™

CLAS-2D™

This model combines the functions of an interferometer, beam profiler, and beam quality meter in one instrument. The system software analyzes optical aberrations including astigmatism, coma, spherical aberration, focus error/collimation, tilt and more.

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ClearWave™ Contact Lens Precision Aberrometer

ClearWave™ Contact Lens Precision Aberrometer

This system is optimized for the development and production of contact lenses. Combining the world's highest resolution Shack-Hartmann Wavefront sensor with a custom designed software package, ClearWave provides superior insight into the performance and production of contact lenses. Measurements include spherical power, cylinder, axis, coma, trefoil, and other high order aberrations.

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CrystalWave™ Intraocular Lens Precision Aberrometer

CrystalWave™ Intraocular Lens Precision Aberrometer

This optical instrument is designed to measure intraocular lenses using Wavefront technology. CrystalWave measures each intraocular lens using a grid of 10,000 lenslets. Measurements include spherical power, cylinder, axis, coma, trefoil, and other high order aberrations.

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CLAS-NX

CLAS-NX

Lumetrics, Inc. has developed the next generation of Complete Light Analysis System (CLAS) software within its line of wavefront sensing instruments. The focus has been on several key elements to enhance the existing feature set of the old software.

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CLAS-FX

CLAS-FX

The CLAS-FX sensor allows for rapid testing of lens stack quality.

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