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  • About
    • About Us
      • Our Company
      • Leadership
      • Events
      • Careers
  • Products
    • Non Contact Thickness Measurement Systems
      • OptiGauge MIR
      • OptiGauge II
      • OptiGauge 2000
      • OptiGauge 600
      • OptiGauge II EMS
      • LUMOS-V
      • STMS
      • LumetriScan 360
      • Software
      • Accessories
    • Wavefront Measurement Systems
      • CLAS-NX
      • CLAS-FX
      • ClearWave Plus
      • Software
      • Accessories
  • Services
    • Our Services
      • Test & Measurement Services
      • Discovery Service
      • Custom Metrology
      • Accessories
  • Applications
    • Applications
      • Mid-Infrared Measurement
      • Multi Layer Thickness Measurement
      • Silicon Wafer Measurement
      • Glass Inspection + Measurement
      • Automotive Glass
      • Medical Device Inspection
      • Ophthalmic Metrology
  • Resources
    • Our Resources
      • Lumetrics Blog
      • White Papers
      • Application Notes
      • Videos
      • FAQs
  • Videos
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Lumetrics Metrology Blog

Explore our articles, videos, and insights on non contact thickness measurement, precision metrology methods, and metrology application trends.
June 13, 2025

Introducing Lumos-V: The Most Precise Commercially Available Non-Contact Refractive Index Metrology System for Contact Lens Manufacturing

LUMOS-V Now Available for Refractive Index Measurement At Lumetrics, innovation is in our ...
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July 27, 2022

Lens Stack Measurement

Did you know that we all carry lens stacks in our pockets? That’s right! Your cell phone ...
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March 30, 2017

Measurement of a Lens Stack

The camera lens stack manufacturing process relies heavily on polished lenses that have ...
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