Fast, Accurate Non-Contact Metrology
Film Thickness Measurement Systems for Multi-Layer Materials
Lumetrics helps manufacturers measure film thickness across multi-layer materials, coatings, laminates, and transparent stacks using non-destructive processes. Our non-contact optical metrology systems deliver fast, repeatable thickness measurement for process control, quality assurance, and regulated production environments where traceable inspection matters.
This is where Lumetrics' non-contact thickness measurement and inspection systems deliver an advantage.
Why Multi-Layer Thickness Measurement Is Difficult
Manufacturers working with films, coatings, and transparent assemblies often outgrow manual or destructive measurement methods. Cross-sections, razor cuts, and indirect calculations can slow inspection, introduce operator variability, and make it harder to maintain a reliable quality record.
As product designs become more complex and tolerance windows tighten, teams need a faster and more objective way to verify individual layers and total stack thicknesses. This is especially important when quality documentation, repeatability, and compliance standards matter as much as raw measurement speed.
What Lumetrics Measures
Lumetrics systems are designed for multi-layer thickness measurement in applications such as:Built for Multi-Layer Thickness Measurement Workflows
Whether you are validating a new product in R&D or inspecting production material at scale, Lumetrics systems can be configured to match your workflow.
The goal is not just to capture thickness values, but to make thickness measurement more useful to engineering, quality, and manufacturing teams.
Recommended Systems for Multi-Layer Materials
Lumetrics builds non-contact thickness measurement systems for complex materials and demanding applications. For many film and multi-layer measurement workflows, OptiGauge II is the best starting point.
- OptiGauge II
OPTIGAUGE® II
OptiGauge II enables simultaneous thickness measurement of multiple layers and coatings in films and other transparent materials. It supports fast, accurate, non-destructive measurement for manufacturers that need better process visibility and more dependable inspection results.
Multilayer Thickness Measurement Resources
Explore application notes, videos, and technical resources that show how Lumetrics systems are used to measure film stacks, packaging materials, coatings, and other multi-layer structures.
See how Lumetrics can improve your film thickness measurement workflow
