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  • About
    • About Us
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    • Non Contact Thickness Measurement Systems
      • OptiGauge MIR
      • OptiGauge II
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      • OptiGauge II EMS
      • STMS
      • LumetriScan 360
      • Software
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      • CLAS-NX
      • CLAS-FX
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      • Software
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      • Accessories
  • Applications
    • Applications
      • Mid-Infrared Measurement
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      • Silicon Wafer Measurement
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      • Automotive Glass
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Lumetrics Metrology Blog

Explore our articles, videos, and insights on non contact thickness measurement, precision metrology methods, and metrology application trends.
March 16, 2020

Multi-layer Measurement with the Lumetrics OptiGauge II

The OptiGauge II is a user-friendly non-contact thickness measurement system for ...
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January 18, 2017

Optical Thickness and Flatness Measurement of Bonded Silicon Wafer Assemblies

Abstract—The silicon wafer manufacturing process relies heavily on precision polished ...
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February 15, 2016

Online Tubing Thickness Measurement

Lumetrics is the leader in online tubing thickness measurement systems for the ...
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July 27, 2015

New OptiGauge product introduced: OptiGauge II

The OptiGauge II is an ideal non-contact thickness measurement system for companies ...
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