In 2025, Lumetrics continued to empower researchers and engineers by delivering precision measurement technologies, making breakthrough innovations possible. With our products, research teams have been pushing the boundaries of what’s measurable, manufacturable, and achievable.
Ranging from simultaneous material analysis and thickness measurement to polarimetric imaging for void detection to optical implications of myopia control contact lenses, today’s innovators are moving faster, validating ideas, and bringing next generation solutions to life.
By Neeraj Kumar Singh | Indiana University
This study explores how myopia‑control contact lenses affect children’s focusing ability, peripheral retinal defocus, and visual comfort, especially during extended digital device use. It evaluates how these lenses alter accommodation behavior and whether they help reduce visual strain in young, tech‑heavy environments.
By Yaosen Deng, Jiewen Lin, Renyu He, Shuncong Zhong, Jianfeng Zhong, & Qiukun Zhang | Fujian Provincial Key Laboratory of Terahertz Functional Devices and Intelligent Sensing
Thickness measurement with spectral‑domain OCT (SD‑OCT) offers nanometer‑level accuracy and high efficiency. However, achieving this precision requires minimizing external errors such as the widely present Abbe second‑order error (ASE). This study analyzes ASE through simulation and sapphire‑measurement experiments, demonstrating that a proposed correction method reduces ASE by 123 nm and enables true nanometer‑level measurement accuracy.
By Zhenghua Lin, Weizhong Lan, Zhikuan Yang & Pablo Artal | Universidad de Murcia, Central South University, Hubei University of Science and Technology
This review summarizes current knowledge on peripheral refraction and its role in driving or slowing myopia progression. It compares measurement methods, highlights trends across populations, and assesses how optical interventions attempt to reshape peripheral focus to manage myopia.
By Paul M. Thomas, Don Gibson, Mike Marcus, & John Pietruszka | SPIE, Lumetrics
This work introduces a multispectral low‑coherence interferometry technique as an optical, non-contact, thickness measurement system for glass and polymers in laminate applications. By leveraging multiple wavelengths, the method provides richer structural information, enabling more accurate characterization of complex or multilayer optical materials.
As we look ahead to 2025 and beyond, it’s clear that the pace of innovation will only accelerate. And Lumetrics will continue to play a critical role in making that progress possible.
By equipping researchers, engineers, and product teams with reliable, high‑precision measurement technologies, we're enabling breakthroughs that shape the future of medical devices, ophthalmic, multilayer film thickness measurement, semiconductor inspection, and precision manufacturing.
Explore how Lumetrics’ advanced measurment solutions can support your next innovation.