During the most recent SPIE Defense and Sensing Conference in National Harbor Maryland Lumetrics' metrology scientist, Paul Thomas, Ph.D discussed the benefits of using low-coherence interferometry to measure materials that are opaque at the Near IR and UV wavelength ranges.
Paul’s presentation shared how non-contact low-coherence interferometry can be used to measure Mid infrared materials such as Ge and NCOC that are visible at 2.5µm or longer.
If you’d like a copy of the presentation or simply want to learn more about Lumetrics’ innovative measurement solutions, please reach out below.