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Application Notes
Silicon Wafer Measurement
Advanced Driver Assistance System Windshield Measurements
Practical Considerations for Choosing an Optical Probe Head
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Non Contact Thickness Measurement Systems
OptiGauge II
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OptiGauge 600
OptiGauge EMS
LumetriScan 360
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CLAS-NX
CLAS-FX
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ClearWave Contact Lens Precision Aberrometer
CrystalWave Intraocular Lens Precision Aberrometer
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Multi Layer Film Thickness Measurement
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Lumetrics Awarded a Small Business Innovation Research Contract from the Army Research Lab
Measurement of Film Stacks in Cell Phones and Tablets Using White Light Interferometry
Accurate measurements of phase refractive index of soft contact lenses
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