Info Center - Resources

Note: Lumetrics has moved since some of our original documentation has been created, thus reflecting our previous address. Our new address is: Eagle's Landing Business Park, 1565 Jefferson Road, #420, Rochester, NY 14623.

Solution Development

• Lumetrics 360 Assessment Process - Technology Feasibility vs. Business Suitability
• Lumetrics Sample Testing Form

Marketing Presentations

• LumetriScan™ Innovation Briefs Presentation, John Hart, MDM East 2011 (June, 2011)
• Non-Contact Measurement and Analysis of Six Micron+ Thin Wall Coatings on Medical Balloons and Catheters Using Low Coherence Interferometry, (July, 2008)
• Lumetrics OptiGauge Presentation

Product Information

• OptiGauge Brochure
• LumetriScan™ Information Sheet
• Tubing Monitor 360
• RoLSS Description
• Automated X/Y Tissue Scanning System
• Extended Support Agreement

Technical Papers

• Measuring Food Packaging Materials - Low-coherence interferometry measures the inside layer on a continuous production line. (Photonics Spectra Magazine, 2008)
• Patent Reform To Benefit IVD Industry - IVD Technology (April 13, 2011)
• Non-Contact Measurement and Analysis of Six Micron+ Thin Wall Coatings on Medical Balloons and Catheters Using Low Coherence Interferometry), (July, 2008
• See how the OptiGauge is being used to measure piezo injectors
• Laser Hazard Analysis
• "Measurement of Multi-Layer Structures Using Non-Contact Reflective Light Technology", presented at SPIE Polyolefins Conference, (March, 2006)
• "Non-Contact Measurement of Absolute Dimensions", presented at the Summer 2005 SPIE conference
• "Uncertainty Evaluation Of a Fiber-Based Interferometer For the Measurement of Absolute Dimensions"), (July, 2005)
• "SPIE Optics East - October, 2004 "; Practical Applications in Film and Optics Measurements for Dual Light Source Interferometry
• "TAPPI Place - September, 2004"; Multi-Layer Film Measurement Using Dual-Light Interferometry
• "Flip Chip Topical Workshop - June, 2004"; Jetting Dispensing of Fluxes for Flip Chip Attachment and Measurement Methods for Ensuring Consistent Flux Coatings
• "Fiber optic instrumentation for industrial process monitoring and control applications", Authored by Michael A. Marcus, Eastman Kodak Company, Proceedings SPIE, vol. 4578, pgs. 136-144, published 2002