Lumetrics Metrology Blog

Explore our articles, videos, and insights on non contact thickness measurement, precision metrology methods, and metrology application trends.
September 27, 2023

Sample Measurement Testing

When it comes to measuring thickness, there are a variety of devices available. However, ...
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August 9, 2023

Simplify Microfluidic Flow Cell Measurements with Low Coherence Interferometry

Low coherence interferometry is a powerful tool that has revolutionized the field of ...
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July 20, 2023

Measure Critical Tubing Parameters Easily With Lumetrics' OptiGauge II

Manufacturers of medical tubing need precision metrology equipment to verify products ...
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July 7, 2023

Developments in Multilayer Measurement

Manufacturers of multilayer materials are constantly searching for ways to improve their ...
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June 7, 2023

Revolutionizing Wafer Inspection: Lumetrics' OptiGauge II for Accurate Bonded Silicon Wafer Measurement

Silicon chip manufacturing is a complex process that requires a suite of advanced ...
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February 27, 2023

OptiGauge II versus OptiGauge EMS: Features and key differences

Watch "Lab Dave" (Technology Development Scientist at Lumetrics) as he demonstrates the ...
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January 17, 2023

Determining Group Refractive Index utlizing the Lumetrics OptiGauge II and RICS Fixture

The refractive index (RI) of a material is how much light is refracted or reflected when ...
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October 25, 2022

Automated Optical Inspection and Multi Layer Measurement

Utilizing optical metrology solutions such as the Lumetrics OptiGauge II to measure ...
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August 24, 2022

Multi Layer Stack Measurement using a Robot and OptiGauge II

In our newest video, David Compertore, Lumetrics' Principal Scientist, measures a stack ...
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July 27, 2022

Lens Stack Measurement

Did you know that we all carry lens stacks in our pockets? That’s right! Your cell phone ...
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